|Title of the article||
THE PROBLEM OF TECHNICAL PREVENT ACCIDENTS OBJECTS OF THE RESPONSIBLE USE
A. Avakyan doctor of technical science, the main scientific worker Institute of Aircraft Equipment
A structure of an electronic circuit element is considered. It is shown that the physical failure model for a circuit element is based on two types of binary events: a conductor break and a dielectric breakdown. The physical failure model is formalized in the form of the binary failure distribution law and the binomial failure distribution law. It is proved with the Lyapunov limit theorem that the failure distribution law for electronics components and systems is normal. Estimates of expectations and probable deviation of failures are obtained for electronic circuit elements.
electronics, element, probability, expectation, dispersion, random quantity, distribution law, normal law, binary law, binomial law, exponential law.
Дата обновления: 30.03.2015 09:39